Kjøp brukt Jeol Feltemitterende Skanningelektronmikroskop (3)

Byggeår: 2022, Tilstand: som ny (utstillingsmaskin), Funksjonalitet: fullt funksjonell, Beskrivelse (detaljert spesifikasjon): Iedpfx Aozn Ihpoqvjba o 5-akset plattform o Moderne, utvidbart brukergrensesnitt med EDX-integrasjon og bildebehandling o SE-detektor o Scintillator-BSE-detektor (kan trekkes tilbake) o In-lens-detektor o Lavvakuumsystem med BSE-detektor (kan trekkes tilbake) o Fullstendig programvareintegrert JEOL-EDX-system (60 mm²) o Strømmåling i kolonnen o Navigeringskamera o Live-kamera o Kontrollpanel o Skrivebord, PC med Windows-operativsystem, 2 x 24" skjerm, tastatur

Tilstand: svært god (brukt), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Ibjdpfezd Ufaox Aqvsa Modern, high-resolution, digital scanning electron microscope with newly developed electron optics and intuitive graphical user interface (GUI) running on Microsoft Windows XP Professional. Machine configuration includes the following features: - Magnification range: 5 X - 300,000 X - Acceleration voltage: 0.3 - 30 kV - Tungsten hairpin cathode (LaB6 cathode optional) - Large fully motorized specimen stage with eccentric tilt, incl. graphical navigation on the specimen holder - Simple sample navigation via click-center-zoom - Field-of-view controlled navigation using 2 navigators - Relative coordinate navigation - Save and recall sample positions - Adjustable image section function for the specimen stage - Field correction during rotation using computer-controlled eccentric rotation - Field correction during tilting via computer-controlled eccentric tilting - Calculation of possible tilt angle based on sample geometry - Automatic focus tracking during Z-axis movement of the sample - Intelligent limit switches for the motorized axes - Specimen stage travel: x = 125 mm, y = 100 mm, z = 5 to 80 mm (continuous), T = -10°C to +90°C, R = 360° (continuous) - Secondary electron detector for high-vacuum operation - Innovative super-conical objective lens ensures highest image resolution even at large tilt angles - Guaranteed resolution in SE image: 3 nm at 30 kV, 15 nm at 1 kV - Simultaneous live image display of multiple detectors - Powerful image measurement functions - Movie function for recording dynamic processes - Versatile specimen chamber with numerous expansion options: free flanges, e.g., for EDX, WDX, EBSD, cathodoluminescence, etc. - Low-maintenance and low-wear, quiet pumping system consisting of fore-vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control - Extensive safety features against operator error and external supply failure - Ergonomic, height-adjustable system table - SEM starter kit including 2 sample holders, tool set, and 6 spare cathodes Additional equipment for scanning electron microscope: - Turbomolecular pump in place of the standard diffusion pump; using a turbomolecular pump eliminates the need for cooling water operation of the SEM. Additional SEM equipment: - PC for SEM control including TFT monitor - ΟΧ200 Bruker Quantax 200 EDX System EXTENDED - Bruker EDX software transferred to new owner after purchase - Nitrogen-free energy-dispersive X-ray analysis system including: - SDD detector with 127 eV or better energy resolution - Detection of all elements starting from boron - Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free) - Pulse processor - TFT monitor - Spectrum measurement and element identification - Fully automatic, quantitative, standardless element analysis - Image acquisition - Super-fast qualitative line scan - Super-fast qualitative element mapping - Data management and archiving system - Report generation and results output - Data communication - Installation and training - HyperMap - Multipoint analysis - Bruker xFlash detector (SDD) with SVE III signal processing unit Scope of delivery: (see photos) Condition: used (Technical data, specifications and information subject to change. Errors and omissions excepted!)

Byggeår: 2024, Tilstand: som ny (utstillingsmaskin), Funksjonalitet: fullt funksjonell, JCM-7000 kombinerer enkel prøvenavigasjon med en rekke avanserte autofunksjoner. Et stort prøvekammer, høy oppløsning og en tilkoblingsbar lavvakuummodus for ikke-ledende prøver gjør denne benk-SEM-en til et mobilt allround-talent. Egenskaper: • SE-/BSE-deteksjon • Forstørrelse opptil x100.000, oppløsning ca. 8 nm • Lavvakuumdrift for ikke-ledende prøver • Integrert EDX-system (både maskinvare og programvare) for elementkarakterisering • Live-elementanalyse, sanntidsavbildning (inkl. 3D-avbildning/topografi) • Intuitiv betjening med oppskrifter, autofunksjoner, bildemontasjer m.m. • Stort kammer for prøver opptil 80 mm i diameter eller 50 mm i høyde Isdjzn Ih Aopfx Aqvoba • Kompakt og mobil • Dimensjoner (hovedenhet): 324 mm B x 586 mm D x 566 mm H