Skanning elektronmikroskop (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Type: Jeol JSM-6490

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)

Modern, high-resolution, digital scanning electron microscope with newly developed electron optics and intuitive graphical user interface (GUI) running on Microsoft Windows XP Professional.

Machine configuration includes the following features:

- Magnification range: 5 X - 300,000 X
- Acceleration voltage: 0.3 - 30 kV
- Tungsten hairpin cathode (LaB6 cathode optional)
- Large fully motorized specimen stage with eccentric tilt, incl. graphical navigation on the specimen holder
- Simple sample navigation via click-center-zoom
- Field-of-view controlled navigation using 2 navigators
- Relative coordinate navigation
- Save and recall sample positions
- Adjustable image section function for the specimen stage
- Field correction during rotation using computer-controlled eccentric rotation
- Field correction during tilting via computer-controlled eccentric tilting
- Calculation of possible tilt angle based on sample geometry
- Automatic focus tracking during Z-axis movement of the sample
- Intelligent limit switches for the motorized axes
- Specimen stage travel: x = 125 mm, y = 100 mm, z = 5 to 80 mm (continuous), T = -10°C to +90°C, R = 360° (continuous)
- Secondary electron detector for high-vacuum operation
- Innovative super-conical objective lens ensures highest image resolution even at large tilt angles
- Guaranteed resolution in SE image: 3 nm at 30 kV, 15 nm at 1 kV
- Simultaneous live image display of multiple detectors
- Powerful image measurement functions
- Movie function for recording dynamic processes
- Versatile specimen chamber with numerous expansion options: free flanges, e.g., for EDX, WDX, EBSD, cathodoluminescence, etc.
- Low-maintenance and low-wear, quiet pumping system consisting of fore-vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control
- Extensive safety features against operator error and external supply failure
- Ergonomic, height-adjustable system table
- SEM starter kit including 2 sample holders, tool set, and 6 spare cathodes

Additional equipment for scanning electron microscope:
- Turbomolecular pump in place of the standard diffusion pump; using a turbomolecular pump eliminates the need for cooling water operation of the SEM.

Additional SEM equipment:
- PC for SEM control including TFT monitor
- ΟΧ200 Bruker Quantax 200 EDX System EXTENDED
- Bruker EDX software transferred to new owner after purchase
- Nitrogen-free energy-dispersive X-ray analysis system including:
- SDD detector with 127 eV or better energy resolution
- Detection of all elements starting from boron
- Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free)
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- Pulse processor
- TFT monitor
- Spectrum measurement and element identification
- Fully automatic, quantitative, standardless element analysis
- Image acquisition
- Super-fast qualitative line scan
- Super-fast qualitative element mapping
- Data management and archiving system
- Report generation and results output
- Data communication
- Installation and training
- HyperMap
- Multipoint analysis
- Bruker xFlash detector (SDD) with SVE III signal processing unit

Scope of delivery: (see photos)

Condition: used

(Technical data, specifications and information subject to change. Errors and omissions excepted!)

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